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【英文标准名称】:TestMethodforRadiologicExaminationofSemiconductorsandElectronicComponents
【原文标准名称】:半导体和电子元件放射性检查试验方法
【标准号】:ANSI/ASTME1161-1996
【标准状态】:现行
【国别】:美国
【发布日期】:1996-10
【实施或试行日期】:
【发布单位】:美国国家标准学会(US-ANSI)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:元部件;半导体;试验;电气工程;放射性试验
【英文主题词】:semiconductors;testing;electricalengineering;components;radiographictesting
【摘要】:Thistestmethodprovidesastandardprocedurefornondestructiveradiographicexaminationofsemiconductordevices,electroniccomponents,andthematerialsusedforconstructionoftheseitems.Thistestmethodcoverstheradiographicexaminationoftheseitemsforpossibledefectiveconditionssuchasextraneousmaterialwithinthesealedcase,improperinternalconnections,voidsinmaterialsusedforelementmounting,orthesealingglass,orphysicaldamage.Thequalitylevelandacceptancecriteriaforthespecimensbeingexaminedshallbespecifiedinthedetaildrawing,purchaseorderorcontract.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:
【正文语种】:英语